Micro and Nanoscale Microscopy Characterization Techniques

Scanning probe microscopy, Scanning electron microscopy, Laser scanning microscopy, Light microscopy, etc.

Session Organizer:

Prof. George A. Stanciu University Politehnica of Bucharest Romania



Yasuhiro Sugawara Osaka University Japan
Photo-induced force microscopy for functional materials

Radu Hristu University Politehnica of Bucharest Romania
Polarization-resolved second harmonic generation microscopy for the characterization of structural defects in silicon carbide

Toru Tomimatsu Tohoku University Japan
Imaging of mechanical stress in ceramics by scanning near-field microscopy

George A. Stanciu University Politehnica of Bucharest Romania
Near field and far field laser microscopy used for materials investigations